Importance of Long Term and Stress Tests in IoT embedded Software Development
September 15, 2020
from 2:00 PM
to 3:00 PM CEST
Integration Test Phase of IoT Devices
The integration test phase of IoT devices is the final and the most important part of the development cycle of any IoT device. It ensures that the design is done as described in the requirements and also that the user will have the best experience, the main goal of any product.
Test success and failures scenarios of the product life cycle involves not only thinking about all the user or subsystem interactions, but also how to reproduce them in the test bench or emulation environment. In the design phase, usually the first part of the product development, it is crucial considering means to trigger all the possible event combinations and check the behavior of the system in an agile way. Considering the long term and stress test is also an important approach to catch memory issues and resources contention.
In this session, Concept Reply highlights the best practices developed in the embedded software team to make sure the testability of the devices since the design phase. Using long term tests stimulating different interfaces at the same time (WiFi, BLE, Serial, etc.), it is possible to prevent deadlocks, memory leaks and unexpected behavior during the product life cycle. Join this webinar and take a look on the experts' experience on long term tests and their design for testability approach.
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